Microwave holography of large reflector antennas--Simulation algorithms

The performance of large reflector antennas can be improved by identifying the location and amount of their surface distortions and then by correcting them. Microwave holography techniques are finding considerable applications as viable tools for performing this task. In these techniques, the complex (amplitude and phase) far-field pattern of the antenna is measured, using a reference antenna. Then, the Fourier transform relationship, which exists between the far field and a function related to the induced current, is invoked to result in the identification of the surface distortions. To critically examine the accuracy of the constructed surface profiles, simulation studies are required to incorporate both the effects of systematic and random distortions, particularly the effects of the displaced surface panels. In this paper, different simulation models are investigated with emphasis given to a model based on the vector diffraction analysis of a curved reflector with displaced panels. The simulated far-field patterns are then used to reconstruct the location and amount of displacement of the surface panels by employing a fast Fourier transform (FFT)/iterative procedure. The sensitivity of the microwave holography technique based on the number of far-field sampled points, level of distortions, polarizations, illumination tapers, etc., is also examined. In addition, the relationships between Az-El and
u-v
spaces are addressed in the Appendix. Most of the data are tailored to the dimensions of the NASA/JPL Deep Space Network (DSN) 64-m reflector antennas for which the result of a recent measurement is also presented.