Why, I/sub DDQ/? (CMOS IC testing)

Summary form only given. The author discusses the research conducted by Ford Microelectronics on the impact that I/sub DDQ /testing will have on the automotive IC industry. This research has been directed toward developing the tools to implement I/sub DDQ/ testing, to identify failure locations, to understand what I/sub DDQ/ identifies, to assess vendor quality levels, and to gauge the reliability impact. The increased sensitivity to processing problems that I/sub DDQ/ testing provides makes it possible to detect infant mortality and early life failures before they become functionally bad. This has been substantiated through lower burn-in failures and life test studies.<
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