A New Method for Measuring Properties of Dielectric Materials Using a Microstrip Cavity (Short Papers)

A new nondestructive method has been developed for measuring the dielectric constant and the loss factor of a slab-type material using a microstrip cavity. The method, which uses a simple and rapid substitution procedure, yields accurate results and has a number of advantages over currently available techniques. Experimental details and the theoretical basis are explained and experimental data are presented.