Measurement of Small Dielectric Losses in Material with a Large Dielectric Constant at Microwave Frequencies

A method is described for measuring dielectric losses at microwave frequencies in materials with a large dielectric constant. By observing a dielectric resonance in a sufficiently large sample, the loss tangent of the material can be obtained. Results on SrTiO/sub 3/, single crystals at 20 kMc are presented.