Effects of skew and demagnetizing fields on NDRO performance

Limitations placed upon the NDRO performance of a magnetic film memory device by the detrimental effects of skew and demagnetizing fields are investigated. An expression has been derived that relates these effects to the NDRO critical magnetization angle for devices whose rotational switching can be characterized by a Stoner-Wohlfarth switching astroid. Experimental results for typical devices are presented that substantiate the theory.