Error minimisation in the measurement of bipolar collector and emitter resistances

An analysis of open-circuited collector and forced beta methods for emitter and collector resistance determination is presented. The analysis particularly focuses attention on high-injection effects and the influences of recombination within, and at the surface of, junction depletion layers. Semiquantitative criteria for minimisation of measurement error evolve and additionally, methods for extraction of certain inverse and nonideal diode parameters are suggested.