Feedthrough in emitter-coupled logic circuits

Emitter coupled logic circuits transient noise behavior is examined. The mechanisms and causes of feedthrough are analyzed using, first, approximate expressions and, second, an accurate model. The experimental observations of feedthrough give ample evidence of good agreement between the theoretical and computational results. An accurate appraisal of the causes of feedthrough, such as C/SUB b//SUB e/, C/SUB b//SUB c/, c/SUB i//SUB d/, C/SUB i//SUB t/, C/SUB p/, and C/SUB c//SUB u//SUB s/ determine the main factors that offer scope for improvement.