Frequency Noise Characterization of Narrow-Linewidth Semiconductor Lasers: A Bayesian Approach

We describe a Bayesian estimation approach to infer on the frequency noise characteristics of narrow-linewidth semiconductor lasers from delayed self-heterodyne beat note measurements. Our technique is grounded in a statistical model of the measurement process that accounts for both the impact of the interferometer and the detector noise. The approach yields accurate results, even in scenarios where the intrinsic linewidth plateau is obscured by detector noise. The analysis is carried out using a Markov-chain Monte Carlo method in the frequency domain and exploits prior knowledge about the statistical distribution of the data. The method is validated using simulated time series data from a stochastic laser rate equation model incorporating
$1/f$
-type non-Markovian noise.