Performance analysis of an ADC histogram test using small triangular waves

The histogram method using small-amplitude triangular waves for the quasi-static test of analog-to-digital converters has been proposed for standardization aims. In this paper, after a brief description of the test procedure, analytical closed-form relations for designing the test, as well as for its characterization in terms of efficiency and uncertainty, are provided. Numerical and experimental results of a comparative analysis with the IEEE 1057-standard static test highlight its better performance in terms of efficiency and accuracy.