An examination of transition noise by Lorentz electron microscopy recording media

The authors discuss recent results of a program, based on Lorentz electron microscopy, which has as its aim the development of quantitative methods to relate the micromagnetic structure of a thin-film recording medium to its recording performance and in particular the noise characteristic. An approach where the noise associated with individual flux reversals is considered and analyzed in terms of two components, transition noise and transition shift noise, is described. It is shown that this method gives a deeper insight into the relationship between micromagnetic structure and noise.<
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