On-die DFT based solutions are sufficient for testing multi-GHz interfaces in manufacturing (and are also key to enabling lower cost ATE platforms)

Based on experiences with 500 MHz to 1 GHz interfaces on high volume CPU and chipset products, it is evident that on-die DFT based solutions are sufficient to screen defects in manufacturing. On-die DFT and test methods can very accurately determine differences in performance (drive, timing, leakage, jitter,...) between the various interface channels on a single device, and the magnitude of the difference can be used as indication of defective channels.