Coping with SEUs/SETs in microprocessors by means of low-cost solutions: a comparison study

In this paper, two low-cost solutions devoted to provide processor-based systems with error-detection capabilities are compared. The effects of single event upsets (SEUs) and single event transients (SETs) are studied through simulation-based fault injection. The error-detection capabilities of a hardware-implemented solution based on parity code are compared with those of a software-implemented solution based on source-level code modification. Radiation testing experiments confirmed results obtained by simulation.