Measurements of optical loss in GaAs/Al/sub 2/O/sub 3/ nonlinear waveguides in the infrared using femtosecond scattering technique

Summary from only given. We measured the loss coefficient for GaAs/Al/sub 2/O/sub 3/ waveguides in the telecommunication window (near 1.5 /spl mu/m) and near 2.0 /spl mu/m, where these waveguides are proven to be strong candidates for nonlinear frequency conversion. Using the scattering technique and femtosecond pulses for the first time the losses were evaluated for semiconductor waveguides over an extended wavelength range from 1.3 to 2.1 /spl mu/m.