Two parameter Bendel model calculations for predicting proton induced upset (ICs)

The two-parameter model of W.L. Bendel and E.L. Petersen (1984) represents an improvement over the existing single-parameter model in terms of the goodness of fit to actual proton upset data. It especially gives a better fit to the data from devices with small feature dimensions, which ultimately leads to a more accurate proton error rate prediction. Small feature sized devices have a proton upset energy dependence that cannot be accurately described with the one-parameter model and only one data point. There are no substantial differences in proton error rate predictions from one- and two-parameter approaches for older devices with larger feature sizes.<
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