Defect recognition via longitudinal mode analysis of high power broad area QW semiconductor lasers

Summary form only given. The lifetime of semiconductor quantum well (QW) lasers is limited by the formation of defects at the facets or in the bulk of the active region. Usually long time aging tests combined with special physical investigations are used to analyze the quality of manufactured lasers. Here, a physical method is presented which allows the precise detection of defects in broad area Fabry-Perot lasers. This method bases on the analysis of longitudinal mode spectra measured below threshold.