Time-domain far-field measurements for cross-correlation analysis

In this work the scanned contribution of a pseudo random noise signal generated in a printed circuit board (PCB) is correlated with the radiated electromagnetic interference (EMI) in the near-field as well as in the far-field. Far-field measurements were performed inside the anechoic chamber for the DUT installed on a rotating table. The proposed cross-correlation spatial-time analysis allows to localize the path of the generated pseudorandom source over the PCB surface and to predict the angular distribution of the radiated emissions from the electronic devices.