Comparative study on data error detection techniques in embedded systems

This paper presents a theoretical comparison of different existing data error detection techniques. The techniques are compared by fault coverage, memory overhead and performance overhead. For this comparison, ten different data error detection techniques are taken into account. In general, the best error detection technique always has the highest fault coverage with low performance and memory overhead. After performing the theoretical comparison, we conclude that GA (genetic algorithm) and SWIFT (software implemented fault tolerance) techniques are the best techniques for data error detection.