On the effectiveness of statistical hypothesis testing in infrared-based face recognition in heterogeneous environments | IEEE Conference Publication | IEEE Xplore

On the effectiveness of statistical hypothesis testing in infrared-based face recognition in heterogeneous environments


Abstract:

In this work, our objective is to study the impact of statistical hypothesis tests for the purpose of improving heterogeneous face recognition (FR). A series of tests are...Show More

Abstract:

In this work, our objective is to study the impact of statistical hypothesis tests for the purpose of improving heterogeneous face recognition (FR). A series of tests are conducted to find the most suitable type of statistical analysis test (parametric vs. non-parametric). To conduct the experiments, we used a multi-spectral face database (visible and Near-IR) collected under challenging conditions, i.e. at night time and at four different standoff distances, namely 30, 60,90 and 120 meters. Next, the selected statistical analysis test is used to find the statistical significance of; (i) image restoration, (ii) fusion of scores. First, Gabor Wavelets, Histogram of gradients (HOG) and Local binary patterns (LBP) feature descriptors are empirically selected. Then the statistical analysis reveals which descriptors result in higher recognition performance. Finally, statistical hypothesis tests are performed to explore the impact of data stratification (grouping of gallery and probe sets) in terms of ethnicity, gender. A set of face identification studies are performed. Experimental results suggest that our proposed image restoration approach, fusion schemes and the usage of stratification result in a significantly better performance results than the baseline, e.g. the rank-one score is improved from 50% to 71% when using image restoration, to 73% when using fusion of scores and to 75% (i.e. in the case of testing FR accuracy only on the female Asian class) when employing database stratification.
Date of Conference: 18-21 August 2016
Date Added to IEEE Xplore: 24 November 2016
ISBN Information:
Conference Location: San Francisco, CA, USA

Contact IEEE to Subscribe

References

References is not available for this document.