A spectral profiling method of mm-wave and terahertz radiation sources

We report on a characterization method of the emission spectrum of mm-Wave and terahertz sources without the use of additional terahertz instruments. It exploits the reciprocal properties of these radiating sources. This method can be applied to any source equipped with an antenna. It has been used to characterize the spectral response of two distinct sources. The first is a 0.35 THz ring oscillator and the second is a 0.55 THz Colpitts oscillator, both implemented in a 65 nm CMOS technology. The results of the proposed characterization method have been verified with an FTIR spectrometer and a commercial harmonic mixer.