All optical characterization of MMICs

Microwave, frequency-domain measurements using optical beams to both deliver the excitation and measure the circuit response are demonstrated on monolithic microwave integrated circuits (MMICs). A modulated diode laser delivers the microwave excitation up to 10 GHz to an integrated MSM (metal semiconductor metal) photodetector driving a MMIC amplifier. The circuit's small-signal response is measured with another laser using electrooptic (EO) sampling. Excitation at frequencies above 10 GHz is demonstrated using the output of two frequency-doubled single frequency lasers mixed together to produce a microwave beat signal.<
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