Jitter in oscillators with 1/f noise sources

A higher 1/f noise corner is introduced in the latest deep sub-micron process. Hence the characterization of jitter due to the 1/f noise becomes crucial for practical applications. This work presents a simple model to relate the time domain jitter and frequency domain phase noise in the presence of 1/f noise sources, and reveals the relationship between the 1/f transition time and the 1/f/sup 3/ phase noise corner. The measured results from ring oscillators fabricated in a 0.18/spl mu/process show that the error of this simple model is within 10%.