The IEEE Xplore database merges a subset of the INSPEC bibliographic database of abstracts, compiled from technical journals published worldwide, with full-page images of all publications. The database contains complete original page images, including all charts, graphs, diagrams, photographs, and illustrative material, from an integrated-circuit schematic to a topographic map to a photograph of a new crystalline structure. All articles, papers, and standards are in PDF format so you see them as published.
Each document--article, paper, and standard--in IEEE Xplore is tagged with a Digital Object Identifier (DOI) for persistent, convenient digital access.