Collections in the IEEE Xplore Database

The IEEE Xplore database contains the following collections:

Journals, transactions, letters, and magazines published by the IEEE and IET, with select content dating back to 1872.
Journals published by IET, American Institute of Physics (AIP), IBM, BIAI (Beijing Institute of Aerospace Information) and TUP (Tsinghua University Press) and dating back to 1930.
Conference proceedings published by the IEEE, IET and VDE VERLAG dating back to 1988.
IEEE technical standards and specifications, including active, revised, archived and draft standards dating from 1948.
eBooks published by Wiley-IEEE Press and other IEEE entities.
Educational courses representing the best of IEEE conferences, workshops, and seminars in an interactive format.

Your access to the content in the IEEE Xplore collections depends on what type of user you are:

Anonymous/Guest users can freely browse and search all collections in IEEE Xplore and view tables of contents and abstracts. Guest users can also purchase individual journal articles, conference papers, eBook chapters, and standards. Guest users can take advantage of personalization features by registering for an IEEE Account.
IEEE members and paid subscribers (individuals and institutions) have access to abstracts with additional details, such as index terms, and full-text content in the IEEE Xplore database.

To see the publications to which you have access, sign in and click in the navigation bar.

In search results, the subscription identifier icon indicates documents where your subscription enables full-text access.

Through IEEE Xplore, all users can purchase additional content available in IEEE Books, published by the IEEE Press and IEEE Societies jointly with John Wiley & Sons. You can browse or search the database for books. When you select a book, IEEE Xplore provides a citation, abstract, and chapter-level table of contents of the book. When available, you can also view searchable PDF files of a representative chapter, preface, and full table of contents. Full text exists outside the IEEE Xplore database.