Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Multi-scale feature extraction and nested-subset classifier designfor high accuracy handwritten character recognition
Jiayong Zhang; Xiaoqing Ding; Changsong Liu
Pattern Recognition, 2000. Proceedings. 15th International Conference on
Volume 2, Issue , 2000 Page(s):581 - 584 vol.2
Digital Object Identifier   10.1109/ICPR.2000.906141
Summary:Both efficient representation and robust classification are essential to high-performance cursive offline handwritten Chinese character recognition. A novel multi-scale feature extraction method is presented based on the information entropy theory. Feature detection and compression are thus combined into an integrated optimization process. A series of optimal feature-spaces are constructed at varying values of the scale parameter and the best one is obtained with the maximum LDA criterion over the scale interval. For more robust classification, we introduce a structure into the Mahalanobis distance classifier and strike the balance between machine capacity and the performance on the training data in light of the ideas of structural risk minimization. A high accuracy recognition system is developed based on the new methods and for the first time, 4 widely different databases ranging from regular to completely unconstrained with several structural distortions and stroke connections are fully tested. The accuracies of 99.S% on regular database and 88.4% on cursive one at the speed of over 40 characters/s are achieved

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved