Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Support vector mixture for classification and regression problems
Tin-Yau Kwok, J.
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Volume 1, Issue , 16-20 Aug 1998 Page(s):255 - 258 vol.1
Digital Object Identifier   10.1109/ICPR.1998.711129
Summary:We study the incorporation of the support vector machine (SVM) into the (hierarchical) mixture of experts model to form a support vector mixture. We show that, in both classification and regression problems, the use of a support vector mixture leads to quadratic programming (QP) problems that are very similar to those for a SVM, with no increase in the dimensionality of the QP problems. Moreover, a support vector mixture, besides allowing for the use of different experts in different regions of the input space, also supports easy combination of different architectures such as polynomial networks and radial basis function networks

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved