Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Automatic parameter selection for polynomial kernel
Ali, S.; Smith, K.A.
Information Reuse and Integration, 2003. IRI 2003. IEEE International Conference on
Volume , Issue , 27-29 Oct. 2003 Page(s): 243 - 249
Digital Object Identifier  
Summary: Kernel is the heart of kernel based learning. To choose an appropriate parameter for a specific kernel is an important research issue in the data mining area. In this paper, we propose an automatic parameter selection approach for polynomial kernel. The algorithm is tested on support vector machines (SVM). The parameter selection is considered on the basis of prior information of the data distribution and Bayesian inference. The new approach is tested on different sizes of benchmark datasets with binary class problems as well as multi class classification problems.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved