Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Semi-Analytical Approach for Analysis of BER in Conventional and Staggered Bit Patterned Media
Livshitz, B.; Inomata, A.; Bertram, H.N.; Lomakin, V.
Magnetics, IEEE Transactions on
Volume 45, Issue 10, Oct. 2009 Page(s):3519 - 3522
Digital Object Identifier   10.1109/TMAG.2009.2022501
Summary:We present a semi-analytical approach for the analysis of synchronization in bit patterned media (BPM) recording. The analysis is based on full numerical micromagnetic calculations of the reversal surfaces of separate BPM element. These reversal surfaces are used to define writing window zones for correct recording in BPM element arrays. The simulations show that staged media lead to improved performance and larger writing window zones (WWZs). The presented model and results are important for estimating BPM designs in terms of density, bit-error rates (BERs), and performance.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved