Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A New Parametric GLRT for Multichannel Adaptive Signal Detection
Pu Wang; Hongbin Li; Himed, B.
Signal Processing, IEEE Transactions on
Volume 58, Issue 1, Jan. 2010 Page(s):317 - 325
Digital Object Identifier   10.1109/TSP.2009.2030835
Summary:A parametric generalized likelihood ratio test (GLRT) for multichannel signal detection in spatially and temporally colored disturbance was recently introduced by modeling the disturbance as a multichannel autoregressive (AR) process. The detector, however, involves a highly nonlinear maximum likelihood estimation procedure, which was solved via a two-dimensional iterative search method initialized by a suboptimal estimator. In this paper, we present a simplified GLRT along with a new estimator for the problem. Both the estimator and the GLRT are derived in closed form at considerably lower complexity. With adequate training data, the new GLRT achieves a similar detection performance as the original one. However, for the more interesting case of limited training, the original GLRT may become inferior due to poor initialization. Because of its simpler form, the new GLRT also offers additional insight into the parametric multichannel signal detection problem. The performance of the proposed detector is assessed using both a simulated dataset, which was generated using multichannel AR models, and the KASSPER dataset, a widely used dataset with challenging heterogeneous effects found in real-world environments.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved