Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Gate Sizing by Lagrangian Relaxation Revisited
Jia Wang; Das, D.; Hai Zhou
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Volume 28, Issue 7, July 2009 Page(s):1071 - 1084
Digital Object Identifier   10.1109/TCAD.2009.2018872
Summary:In this paper, we formulate the generalized convex sizing (GCS) problem that unifies the sizing problems and applies to sequential circuits with clock-skew optimization. We revisit the approach to solve the sizing problem by Lagrangian relaxation, point out several misunderstandings in the previous paper, and extend the approach to handle general convex delay functions in the GCS problems. We identify a class of proper GCS problems whose objective functions in the simplified dual problem are differentiable and transform the simultaneous sizing and clock-skew optimization problem into a proper GCS problem. We design an algorithm based on the method of feasible directions and min-cost network flow to solve proper GCS problems. The algorithm will provide evidences for infeasible GCS problems according to a condition derived by us. Experimental results confirm the efficiency and the effectiveness of our algorithm when the Elmore delay model is used.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved