Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Real-time EEG analysis with subject-specific spatial patterns for abrain-computer interface (BCI)
Guger, C.; Ramoser, H.; Pfurtscheller, G.
Rehabilitation Engineering, IEEE Transactions on
Volume 8, Issue 4, Dec 2000 Page(s):447 - 456
Digital Object Identifier   10.1109/86.895947
Summary:Electroencephalogram (EEG) recordings during right and left motor imagery allow one to establish a new communication channel for, e.g., patients with amyotrophic lateral sclerosis. Such an EEG-based brain-computer interface (BCI) can be used to develop a simple binary response for the control of a device. Three subjects participated in a series of on-line sessions to test if it is possible to use common spatial patterns to analyze EEG in real time in order to give feedback to the subjects. Furthermore, the classification accuracy that can be achieved after only three days of training was investigated. The patterns are estimated from a set of multichannel EEG data by the method of common spatial patterns and reflect the specific activation of cortical areas. By construction, common spatial patterns weight each electrode according to its importance to the discrimination task and suppress noise in individual channels by using correlations between neighboring electrodes. Experiments with three subjects resulted in an error rate of 2, 6 and 14% during on-line discrimination of left- and right-hand motor imagery after three days of training and make common spatial patterns a promising method for an EEG-based brain-computer interface

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved