Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Automatic markup of neural cell membranes using boosted decision stumps
Venkataraju, K.U.; Paiva, A.; Jurrus, E.; Tasdizen, T.
Biomedical Imaging: From Nano to Macro, 2009. ISBI apos;09. IEEE International Symposium on
Volume , Issue , June 28 2009-July 1 2009 Page(s):1039 - 1042
Digital Object Identifier   10.1109/ISBI.2009.5193233
Summary:To better understand the central nervous system, neurobiologists need to reconstruct the underlying neural circuitry from electron microscopy images. One of the necessary tasks is to segment the individual neurons. For this purpose, we propose a supervised learning approach to detect the cell membranes. The classifier was trained using AdaBoost, on local and context features. The features were selected to highlight the line characteristics of cell membranes. It is shown that using features from context positions allows for more information to be utilized in the classification. Together with the nonlinear discrimination ability of the AdaBoost classifier, this results in clearly noticeable improvements over previously used methods.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved