Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Geometry-Based Edge Clustering for Graph Visualization
Weiwei Cui; Hong Zhou; Huamin Qu; Pak Chung Wong; Xiaoming Li
Visualization and Computer Graphics, IEEE Transactions on
Volume 14, Issue 6, Nov.-Dec. 2008 Page(s):1277 - 1284
Digital Object Identifier   10.1109/TVCG.2008.135
Summary:Graphs have been widely used to model relationships among data. For large graphs, excessive edge crossings make the display visually cluttered and thus difficult to explore. In this paper, we propose a novel geometry-based edge-clustering framework that can group edges into bundles to reduce the overall edge crossings. Our method uses a control mesh to guide the edge-clustering process; edge bundles can be formed by forcing all edges to pass through some control points on the mesh. The control mesh can be generated at different levels of detail either manually or automatically based on underlying graph patterns. Users can further interact with the edge-clustering results through several advanced visualization techniques such as color and opacity enhancement. Compared with other edge-clustering methods, our approach is intuitive, flexible, and efficient. The experiments on some large graphs demonstrate the effectiveness of our method.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved