Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Group Testing for Binary Markov Sources: Data-Driven Group Queries for Cooperative Sensor Networks
Hong, Y.-W.P.; Scaglione, A.
Information Theory, IEEE Transactions on
Volume 54, Issue 8, Aug. 2008 Page(s):3538 - 3551
Digital Object Identifier   10.1109/TIT.2008.926363
Summary:Group testing has been used in many applications to efficiently identify rare events in a large population. In this paper, the concept of group testing is generalized to applications with correlated source models to derive scheduling policies for sensors' adopting cooperative transmissions. The tenet of our work is that in a wireless sensor network it is advantageous to allocate the same channel dimensions to all sensor sources that have the same response to a sequence of queries or tests. That is, nodes that have the same data attributes should transmit as a cooperative super-source. Specifically, we consider the case where sensors' data are modeled spatially as a one-dimensional Markov chain. Two strategies are considered: the recursive algorithm and the tree-based algorithm. The recursive scheme allows us to illustrate the performance of group testing for finite populations while the tree-based algorithm is used to derive the achievable scaling performances of the class of group testing strategies as the number of sensors increases. We show that the total number of queries required to gather all sensors' data scales in the order of the joint entropy. A further generalization of this concept provides the basis of deriving efficient data-gathering algorithms for correlated sources.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved