Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Imposing structure on Smith-form decompositions of rationalresampling matrices
Evans, B.L.; Gardos, T.R.; McClellan, J.H.
Signal Processing, IEEE Transactions on
Volume 42, Issue 4, Apr 1994 Page(s):970 - 973
Digital Object Identifier   10.1109/78.285665
Summary:Imposing structure on the Smith form of an (integer) periodicity matrix N=UΛV leads to efficient multidimensional (m-D) DFT implementations (Guessoum, 1984). For nonsingular integer and rational matrices, the authors introduce algorithms to generate U (or V) matrices with minimum norm and Λ matrices whose diagonal elements exhibit minimum variance. Such structure simplifies nonuniform m-D filter-bank design (Gardos et al. 1992)

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved