IEEE standard test access port and boundary-scan architecture

IEEE Std 1149.1-2001
Volume , Issue , 2001 Page(s):i - 200
Digital Object Identifier   10.1109/IEEESTD.2001.92950
Summary:Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous description of the component-specific aspects of such testability features.

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