Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

New insights on the transient and steady-state behavior of thequantized LMS algorithm
Bershad, N.J.; Bermudez, J.C.M.
Signal Processing, IEEE Transactions on
Volume 44, Issue 10, Oct 1996 Page(s):2623 - 2625
Digital Object Identifier   10.1109/78.539047
Summary:This correspondence investigates the transient and steady-state behavior of the quantized LMS algorithm for Gaussian inputs. It is shown here that the so-called “stopping” phenomenon is really a “slow-down” phenomenon, which, because of an extremely slow convergence rate, looks as if the algorithm has stopped. The true steady-state MSE is shown to be nearly independent of the number of bits in the digital word-length and very nearly the steady-state MSE of the infinite precision LMS realization. These results assume that the algorithm “misadjustment” effects due to coefficient quantization are negligible in comparison with those due to the “stopping” phenomena. Since the true steady state is rarely achievable with a finite number of iterations, determination of the step size μ that minimizes the residual MSE must be based on a stochastic model for the transient mode of algorithm operation. It is shown that the finite word length and infinite precision design cases differ only in degree and not in kind as far as the selection of μ is concerned

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved