Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Comparison and fusion of multiresolution features for texture classification
Shu-Tao Li; Yi Li; Yao-Nan Wang
Machine Learning and Cybernetics, 2004. Proceedings of 2004 International Conference on
Volume 6, Issue , 26-29 Aug. 2004 Page(s): 3684 - 3688 vol.6
Digital Object Identifier  
Summary: We investigate the texture classification problem with individual and combined multiresolution features, i.e., dyadic wavelet frame, Gabor wavelet, and steerable pyramid. The support vector machines are used as classifiers. The experimental results show that the steerable pyramid and Gabor wavelet classify texture images with the highest accuracy, the wavelet frame follows them, and the dyadic wavelet significantly lags them. Experimental results on fused features demonstrate the combination of two feature sets always outperform each method individually. And the fused feature sets of multi-orientation decompositions and stationary wavelet achieve the highest accuracy.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved