Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Compact Subnanosecond Pulse Generator Using Avalanche Transistors for Cell Electroperturbation Studies
Krishnaswamy, P.; Kuthi, A.; Vernier, P.T.; Gundersen, M.A.
Dielectrics and Electrical Insulation, IEEE Transactions on
Volume 14, Issue 4, Aug. 2007 Page(s):873 - 877
Digital Object Identifier   10.1109/TDEI.2007.4286518
Summary:Research on the electroperturbation effects of ultrashort high field pulses in cancer cells requires subnanosecond rise time, high voltage pulses delivered to low impedance biological loads. Here we present a compact solid-state pulse generator developed for this application. The pulse is generated by switching a chain of avalanche transistors configured as a tapered transmission line from high voltage to ground. The system features a built in 1400:1 capacitively compensated resistive voltage divider. The divider, with a 3 dB point at 910 MHz, overcomes challenges in the direct measurement of the high frequency components of the output pulse. The generator is capable of producing a 0.8 ns rise time, 1.3 ns wide, 1.1 kV pulse into a 50 Omega load at a maximum repetition rate of 200 kHz. Techniques to implement physical layouting strategies to achieve subnanosecond rise times are outlined. Problems faced in integrating the subnanosecond pulse generator with a biological load are discussed. This pulse generator will be used in experiments aimed at electromanipulation of intracellular biomolecular structures.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved