Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Effects of a finite axial magnetic field on the beam loading on a cavity
Kowalczyk, R.; Lau, Y.Y.; Gilgenbach, R.M.
Plasma Science, 2004. ICOPS 2004. IEEE Conference Record - Abstracts. The 31st IEEE International Conference on
Volume , Issue , 28 June-1 July 2004 Page(s): 275 -
Digital Object Identifier   10.1109/PLASMA.2004.1339926
Summary: Summary form only given. The effect of a finite axial magnetic field on the beam loading of a cavity is evaluated. The calculation extends Branch's classic paper on ballistic bunching in that both the conductive and reactive components of the beam-loaded admittance are computed, and for general values of axial magnetic field. Also included is a comparison of the analytic formulation with the 2-dimensional particle-in-cell code, Magic 2D, for a klystron cavity operating at 5.087 GHz. This work suggests that the finite axial magnetic field used in linear beam tubes (typically exceeding 1.5 times the Brillouin field) would only modify the beam-loaded conductance by about 5 percent, and the beam-loaded susceptance by about 15 percent from that computed under the assumption of an infinite axial magnetic field. The analytic formulation yields beam-loaded conductance and admittance within 4 percent MAGIC 2D simulations on this model.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved