Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A mutual coupling model for MIMO systems
Ozdemir, M.K.; Arslan, H.; Arvas, E.
Wireless Communication Technology, 2003. IEEE Topical Conference on
Volume , Issue , 15-17 Oct. 2003 Page(s): 306 - 307
Digital Object Identifier   10.1109/WCT.2003.1321534
Summary: Wireless communication systems employing multielement antennas (MEAs) are affected by mutual coupling. Accurate and simple models of mutual coupling are essential for better system analysis. In a MEA, mutual coupling depends on the antenna element separation, geometry of array and antenna elements, location of antenna elements in the array, frequency, substrate thickness and constant, near-field scatterers, and direction of arrival (DOA) of the incoming wave. Except near-field scatterers and DOA, the rest of the parameters are fixed for a given MEA system. Since the feeding network for a MIMO system is fixed and most of the mutual coupling is due to surface waves, DOA dependency can be removed for a MIMO mutual coupling model. In this paper, a previously proposed model for mutual coupling is modified to be applicable to MIMO systems. The effect of near-field scatterers on the mutual coupling is specifically investigated to validate the model. Commercially available EM simulators are utilized for this purpose. Once the effect of near-field scatterers is characterized, correlation properties between antenna elements in a MEA can be obtained more accurately and correlation estimation algorithms can be developed accordingly.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved