Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

PRIX: indexing and querying XML using prufer sequences
Praveen Rao; Moon, B.
Data Engineering, 2004. Proceedings. 20th International Conference on
Volume , Issue , 30 March-2 April 2004 Page(s): 288 - 299
Digital Object Identifier   10.1109/ICDE.2004.1320005
Summary: We propose a new way of indexing XML documents and processing twig patterns in an XML database. Every XML document in the database can be transformed into a sequence of labels by Prufer's method that constructs a one-to-one correspondence between trees and sequences. During query processing, a twig pattern is also transformed into its Prufer sequence. By performing subsequence matching on the set of sequences in the database, and performing a series of refinement phases that we have developed, we can find all the occurrences of a twig pattern in the database. Our approach allows holistic processing of a twig pattern without breaking the twig into root-to-leaf paths and processing these paths individually. Furthermore, we show that all correct answers are found without any false dismissals or false alarms. Experimental results demonstrate the performance benefits of our proposed techniques.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved