Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Multicarrier channel shortening based on second-order output statistics
Miyajima, T.; Zhi Ding
Signal Processing Advances in Wireless Communications, 2003. SPAWC 2003. 4th IEEE Workshop on
Volume , Issue , 15-18 June 2003 Page(s): 145 - 149
Digital Object Identifier  
Summary: The paper presents two blind channel shortening algorithms exploiting the second-order statistics of the channel outputs. The shortening equalizer parameter vector is chosen from a null-space that forces a length constraint on the effective channel impulse response. The first algorithm is less sensitive to channel order estimation errors, whereas the second one is simpler to implement. The performance of the proposed algorithms is demonstrated through simulations.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved