Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Indoor MIMO channels: a parametric correlation model and experimental results
Shuangquan Wang; Raghukumar, K.; Abdi, A.; Wallace, J.; Jensen, M.
Advances in Wired and Wireless Communication, 2004 IEEE/Sarnoff Symposium on
Volume , Issue , 26-27 Apr 2004 Page(s): 1 - 5
Digital Object Identifier   10.1109/SARNOF.2004.1302827
Summary: Accurate modeling of indoor multiple-input multiple-output (MIMO) channels is an important prerequisite for multi-antenna system design. In this paper, a new model for indoor MIMO channels is proposed, and a closed-form expression for the spatio-temporal cross-correlation function between any two subchannels is derived. This new analytical correlation expression includes many key physical parameters of interest such as mean angle-of-departure at the transmitter and mean angle-of-arrival at the receiver, the associated angle spreads, the distance between transmitter and receiver, etc. in a compact form. Comparison of this model with channel correlations and capacity, using the collected indoor MIMO data, exhibits the utility of the model.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved