Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

End-to-end WAN service availability
Dahlin, M.; Chandra, B.B.V.; Lei Gao; Nayate, A.
Networking, IEEE/ACM Transactions on
Volume 11, Issue 2, Apr 2003 Page(s): 300 - 313
Digital Object Identifier   10.1109/TNET.2003.810312
Summary: This paper seeks to understand how network failures affect the availability of service delivery across wide-area networks (WANs) and to evaluate classes of techniques for improving end-to-end service availability. Using several large-scale connectivity traces, we develop a model of network unavailability that includes key parameters such as failure location and failure duration. We then use trace-based simulation to evaluate several classes of techniques for coping with network unavailability. We find that caching alone is seldom effective at insulating services from failures but that the combination of mobile extension code and prefetching can improve average unavailability by as much as an order of magnitude for classes of service whose semantics support disconnected operation. We find that routing-based techniques may provide significant improvements but that the improvements of many individual techniques are limited because they do not address all significant categories of network failures. By combining the techniques we examine, some systems may be able to reduce average unavailability by as much as one or two orders of magnitude.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved