Analysis of the PLL jitter due to power/ground and substrate noise
Heydari, P.
Circuits and Systems I: Regular Papers, IEEE Transactions on
Volume 51, Issue 12, Dec. 2004 Page(s): 2404 - 2416
Digital Object Identifier 10.1109/TCSI.2004.838240
Summary:Phase-locked loops (PLL) in radio-frequency (RF) and mixed analog-digital integrated circuits (ICs) experience substrate coupling due to the simultaneous circuit switching and power/ground (P/G) noise which translate to a timing jitter. In this paper. an analysis of the PLL timing jitter due to substrate noise resulting from P/G noise and large-signal switching is presented. A general comprehensive stochastic model of the substrate and P/G noise sources in very large-scale integration (VLSI) circuits is proposed. This is followed by calculation of the phase noise of the constituent voltage-controlled oscillator (VCO) in terms of the statistical properties of substrate and P/G noise. The PLL timing jitter is then predicted in response to the VCO phase noise. Our mathematical method is utilized to study the jitter-induced P/G noise in a CMOS PLL, which is designed and simulated in a 0.25-μm standard CMOS process. A comparison between the results obtained by our mathematical model and those obtained by HSPICE simulation prove the accuracy of the predicted model.
View citation and abstract |
Cart
