Minimizing defective part level using a linear programming-based optimal test selection method
Yuxin Tian; Grimaila, M.R.; Weiping Shi; Mercer, M.R.
Test Symposium, 2003. ATS 2003. 12th Asian
Volume , Issue , 16-19 Nov. 2003 Page(s): 354 - 359
Digital Object Identifier   10.1109/ATS.2003.1250836
Summary: Recent probabilistic test generation approaches have proven that detecting single stuck-at-faults multiple times is effective at reducing the defective part level (DPL). Unfortunately, these test generation strategies increase the number of test patterns. In this paper, we present a novel linear programming-based method to accelerate the optimal selection of test sets to minimize the defective part level based upon the MPG-D model. Our experimental results show that the proposed method is on average 300 times faster than the existing test pattern selection method.

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