Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

A pairwise error probability bound for the exponential- server timing channel
Wagner, A.B.; Anantharam, V.
Communications, 2003. ICC apos;03. IEEE International Conference on
Volume 5, Issue , 11-15 May 2003 Page(s): 3472 - 3476 vol.5
Digital Object Identifier   10.1109/ICC.2003.1204100
Summary: We exhibit upper and lower bounds on the pairwise error probability of the exponential-server timing channel in terms of an appropriately-defined distance between codewords. We show that this distance plays a crucial role in determining the reliability function at low rates. In particular, by lower bounding the minimum distance of good-low rates codes, we provide an improved lower bound on the reliability function of the channel at rate zero. This improved bound proves that at low rates, the exponential-server timing channel is strictly more reliable than the related Poisson channel with zero dark current, answering an open question posed by Arikan. Some remarks are also made about using the results of this paper to prove an improved upper bound on the reliability function at rate zero.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved