Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Quantitative remote sensing of spatially/temporally variable factors on the land surface
Li Xiaowen
Communications, Circuits and Systems and West Sino Expositions, IEEE 2002 International Conference on
Volume 2, Issue , 29 June-1 July 2002 Page(s): 1602 - 1609 vol.2
Digital Object Identifier  
Summary: The significance of quantitative remote sensing of the environment is explained in this paper. Combining the practical circumstances for domestic and abroad situations, the problems facing remote sensing and the necessity to strengthen the basic research of remote sensing is emphasized. Furthermore, the current research status is briefed and our primary academic approaches in our 973 project, including the GO model, scaling effect study, and ill-conditioned inversion theory is introduced in detail.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved