Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Saturation effects in testing of formal models
Menzies, T.; Owen, D.; Cukic, B.
Software Reliability Engineering, 2002. ISSRE 2002. Proceedings. 13th International Symposium on
Volume , Issue , 2002 Page(s): 15 - 26
Digital Object Identifier   10.1109/ISSRE.2002.1173208
Summary:Formal analysis of software is a powerful analysis tool, but can be too costly. Random search of formal models can reduce that cost, but is theoretically incomplete. However, random search of finite-state machines exhibits an early saturation effect, i.e., random search quickly yields all that can be found, even after a much longer search. Hence, we avoid the theoretical problem of incompleteness, provided that testing continues until after the saturation point. Such a random search is rapid, consumes little memory, is simple to implement, and can handle very large formal models (in one experiment shown here, over 10178 states).

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved