Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Stochastic differential equations and geometric flows
Unal, G.; Krim, H.; Yezzi, A.
Image Processing, IEEE Transactions on
Volume 11, Issue 12, Dec 2002 Page(s): 1405 - 1416
Digital Object Identifier   10.1109/TIP.2002.804568
Summary: In previous years, curve evolution, applied to a single contour or to the level sets of an image via partial differential equations, has emerged as an important tool in image processing and computer vision. Curve evolution techniques have been utilized in problems such as image smoothing, segmentation, and shape analysis. We give a local stochastic interpretation of the basic curve smoothing equation, the so called geometric heat equation, and show that this evolution amounts to a tangential diffusion movement of the particles along the contour. Moreover, assuming that a priori information about the shapes of objects in an image is known, we present modifications of the geometric heat equation designed to preserve certain features in these shapes while removing noise. We also show how these new flows may be applied to smooth noisy curves without destroying their larger scale features, in contrast to the original geometric heat flow which tends to circularize any closed curve.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved